3 article(s) from Kapusta, Czesław
Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO2 substrates
- Aleksandra Szkudlarek,
- Jan M. Michalik,
- Inés Serrano-Esparza,
- Zdeněk Nováček,
- Veronika Novotná,
- Piotr Ozga,
- Czesław Kapusta and
- José María De Teresa
Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18
Correction: Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods
- Aleksandra Szkudlarek,
- Alfredo Rodrigues Vaz,
- Yucheng Zhang,
- Andrzej Rudkowski,
- Czesław Kapusta,
- Rolf Erni,
- Stanislav Moshkalev and
- Ivo Utke
Beilstein J. Nanotechnol. 2015, 6, 1935–1936, doi:10.3762/bjnano.6.196
Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods
- Aleksandra Szkudlarek,
- Alfredo Rodrigues Vaz,
- Yucheng Zhang,
- Andrzej Rudkowski,
- Czesław Kapusta,
- Rolf Erni,
- Stanislav Moshkalev and
- Ivo Utke
Beilstein J. Nanotechnol. 2015, 6, 1508–1517, doi:10.3762/bjnano.6.156
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